Engineering
Buffer Layer
10%
Bulk Carrier
16%
Carrier Concentration
17%
Carrier Mobility
13%
Coherence Time
12%
Dielectric Function
5%
External Magnetic Field
16%
Focused Ion Beam
25%
Graphene
9%
Growth Temperature
25%
Lattice Image
12%
Length Scale
8%
Limitations
18%
Low-Temperature
5%
Nanomaterial
8%
Nanometre
12%
Nanoscale
65%
Near-field scanning optical microscope
19%
Nuclear Spin
12%
Optical Probe
16%
Photocurrent
16%
Photovoltaics
16%
Preliminary Investigation
8%
Quantum Computation
12%
Qubit
25%
Realization
12%
Recrystallization
12%
Research Councils
12%
Resistance-Voltage
16%
Silicon Wafer
12%
Solar Cell
7%
Spatial Resolution
12%
Surface State
8%
Temporal Resolution
6%
Terahertz
100%
Thin Films
17%
Time Domain
7%
Transmissions
12%
Material Science
Advanced Material
8%
Bismuth
25%
Buffer Layer
16%
Carrier Concentration
27%
Carrier Lifetime
9%
Carrier Mobility
19%
Charge Carrier
11%
Crystalline Material
8%
Device Fabrication
5%
Dielectric Material
14%
Electron Mobility
29%
Electronic Property
13%
Emission Spectroscopy
16%
Film
8%
Fourier Transform Infrared Spectroscopy
8%
Functional Material
12%
Graphene
17%
Heterojunction
16%
Metamaterials
8%
Molecular Beam Epitaxy
10%
Nanostructure
8%
Nanowires
45%
Novel Material
12%
Permittivity
16%
Photoconductivity
11%
Photovoltaics
33%
Semiconductor Device
8%
Semiconductor Material
8%
Semimetals
16%
Silicon
7%
Single Crystal
16%
Solar Cell
24%
Terahertz Spectroscopy
69%
Thin Films
35%
Tomography
11%
Toxic Material
5%
Two-Dimensional Material
15%
Waveguide
8%
Physics
Coherent Light
16%
Conductance
8%
Cryogenics
8%
Deep Space
25%
Dielectric Material
8%
Electromagnetic Spectra
25%
Electron Mobility
8%
Electron Tunneling
16%
Exciton
33%
FTIR Spectroscopy
8%
Holes (Electron Deficiencies)
16%
Insulation
8%
Metamaterial
8%
Microscopy
8%
Nanoscale
70%
Nanowires
29%
Photoelectric Emission
16%
Probe
8%
Quantum Mechanics
25%
Radio Astronomy
25%
Room Temperature
8%
Scanning Tunneling Microscopy
16%
Scattering
8%
Semiconductor (Material)
8%
Semiconductor Device
8%
Single Crystal
8%
Surface Layers
8%
Tomography
8%
Topological Insulator
6%
Transition Metal Dichalcogenide
10%
Transport Process
16%
Van Der Waals Heterostructures
16%
Waveguide
8%