Abstract
HAXPES measurements were carried out using a Scienta Omicron HAXPES instrument to provide reference spectra for depleted uranium dioxide. High purity uranium dioxide, as confirmed by trace elemental analysis and X-ray Diffraction, was synthesized via the integrated dry route from uranium hexafluoride. The material was fixed on double sided carbon tape for the analysis with charge control measures in place. The expanded energy range, using a Ga Kα Xray source, presents core level photoelectrons not observed in traditional XPS. In addition, a region associated with the X-ray induced Auger transitions MNN is evident at binding energies only achievable with HAXPES. The reference spectra presented here act as the first in a line of proposed investigations into the comparison of XPS and HAXPES from surface to in bulk as well as a fundamental understanding of the electronic structure of uranium materials.
Original language | English |
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Article number | 014003 |
Journal | Surface Science Spectra |
Volume | 31 |
Issue number | 1 |
Early online date | 12 Jan 2024 |
DOIs | |
Publication status | Published - 1 Jun 2024 |
Keywords
- Uranium Dioxide
- HAXPES
- XPS
- Sceinta Omicron
- nuclear fuel
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Hard X-ray Photoelectron Spectroscopy (HAXPES)
Spencer, B. (Senior Technical Specialist) & Flavell, W. (Academic lead)
Faculty of Science and EngineeringFacility/equipment: Facility
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Surface Characterisation
Spencer, B. (Core Facility Lead), Nikiel, M. (Technical Specialist), Sheraz, S. (Technical Specialist), Li, K. (Technical Specialist), Dwyer, L. (Technical Specialist), Wall, S. (Technical Specialist), Williams, W. (Technical Specialist), Forrest, A. (Senior Technician), Fong, J. (Senior Technician), Filip, T. (Technician), Kundu, S. (Technical Specialist), Moore, K. (Academic lead), Walton, A. (Academic lead) & Lockyer, N. (Academic lead)
FSE ResearchFacility/equipment: Facility