Secondary ion mass spectrometry

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• Time-of-Flight Secondary Ion Mass Spectrometry

  Lockyer, N. (Academic lead) & Sheraz, S. (Technical Specialist)

  Materials Engineering

  Facility/equipment: Facility

• Surface Characterisation

  Spencer, B. (Core Facility Lead), Nikiel, M. (Technical Specialist), Sheraz, S. (Technical Specialist), Li, K. (Technical Specialist), Dwyer, L. (Technical Specialist), Wall, S. (Technical Specialist), Williams, W. (Technical Specialist), Forrest, A. (Senior Technician), Fong, J. (Senior Technician), Filip, T. (Technician), Kundu, S. (Technical Specialist), Moore, K. (Academic lead), Walton, A. (Academic lead) & Lockyer, N. (Academic lead)

  FSE Research

  Facility/equipment: Facility

• Nanoscale Secondary Ion Mass Spectrometry (NanoSIMS)

  Moore, K. (Academic lead) & Li, K. (Technical Specialist)

  Materials Engineering

  Facility/equipment: Facility